Matteo SONZA REORDA's Research Activities
Matteo SONZA REORDA is the leader of the CAD group existing within the
Dipartimento
di
Automatica
e Informatica of the Politecnico di Torino.
His interests cover the following research areas:
- Test and Diagnosis of Electronic Circuits and Systems
- Fault Tolerant Electronic Circuit and System Design.
Matteo SONZA REORDA is the author of about 400 papers
in these areas.
He received several awards for his research work, including the C.V.
Ramamoorthy Best Paper award at the 9th IEEE International
Conference on Tools with Artificial Intelligence (1997), the Best
Paper award at the IEEE European Test Symposium (2005), the Best
Paper award at the IEEE Conference on Design and Test in Europe
(2005) and the Best Paper award at the IEEE International Symposium
on Design and Diagnostics of Electronic Circuits and Systems (2013).
Two PhD students he tutored (Paolo Bernardi and Luca Sterpone)
received the EDAA
Outstanding Dissertation Award in 2006 and 2007, respectively.
He has been the General Co-chair (1998) and Program Co-chair (2002
and 2003) of the IEEE International On-Line Testing Symposium (IOLTS). He has
been the Program Chair of the 9th IEEE Workshop on Design and
Diagnostics of Electronic Circuits & Systems and the General
Chair of the 13th IEEE European Test Symposium 2008 (ETS). He has also been the
Program Co-Chair of the 14th IEEE Latin-American Test
Workshop (LATW2013)
and the Co-Program Chair of the 17th IEEE Latin-American
Test Sympoisum (LATS2016).
He has been the Program Co-Chair of the 25th IFIP/IEEE International
Conference on Very Large Scale Integration (VLSI-SoC2017) and of
the 32nd Symposium on Circuits and Systems Design (SBCCI2019).
He serves as a member in the Program Committee of several events,
including DATE, IOLTS, ATS, LATS, DDECS, VLSI-SOC. He is the Chair of
the Steering Committe of the IEEE European Test Symposium (ETS) and a member of the
Steering Committees of the IEEE International On-Line Test Symposium
(IOLTS)
and of the IEEE Latin-American Test Symposium (LATS).
He is the scientific responsible for several National and
International research projects funded by industries and public
bodies.
He has also been (from 2009 to 2013) the elected chair of the
European Group of the IEEE Test
Technology Technical Committee (TTTC).
He is a member of the IFIP
Working Group 10.5 and of the Politecnico di Torino Chapter of
IEEE Eta Kappa Nu (HKN).
He is a Fellow of IEEE.
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